ECSS-Q-TM-30-12A – End-of-life parameter drifts – EEE components

Scope and limitations

This Technical Memorandum is suitable for all parties involved at all levels in the realization of space segment hardware and its interfaces.
The objective of this Technical Memorandum is to provide data about end-of-life parameter drifts and their use for equipment performance assessment up to the equipment end-of-life.

To this end, the following are supplied:

– Estimation of end-of-life drifts due to ageing;
– Methodology guidelines and recommendations.

The reported ageing drifts in Clause 6 should not be confused with the endurance test drift limits allowed in the relevant ESCC specifications (table 4 or 6). The drift values reported here are based on effective life test results and extrapolated for operating temperature maxima respecting derating rules.

The selected data is derived from limited test samples, representative of the knowledge presently available as analysed by the ECSS WG.
End of life is one of the contributor of the Worst Case Circuit Analysis, others being Temperature, tolerance and radiation.

Attachments:


This handbook supports following ECSS Standard: ECSS-Q-ST-30-11C Rev.1 – Derating – EEE components ( 4 October 2010)