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process control monitor

Standard

ECSS-Q-ST-60-12C - Design, selection, procurement and use of die form monolithic microwave integrated circuits (MMICs) - (31 July 2008)

Definition

test vehicle used by the supplier to assess the stability of the manufacturing process by means of controls conducted during a wafer production cycle

Notes

NOTE The PCM is repeated a number of times (depending on the manufacturers) on each wafer lot. The measurements taken during the PCM are used to accept or reject the wafer according to the relevant DC and RF criteria defined in the design manual.

Relations

ECSS-Q-ST-70-56C — cycle
ECSS-Q-ST-70-57C — cycle
ECSS-Q-ST-60-12C — PCM
ECSS-Q-ST-70-39C — process
ECSS-S-ST-00-01C — process
ECSS-E-ST-60-10C — stability
ECSS-E-ST-60-21C — stability
ECSS-S-ST-00-01C — supplier
ECSS-S-ST-00-01C — test
ECSS-Q-ST-70-38C Rev.1 Corr.1 — test vehicle

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