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junction temperature

Standard

ECSS-Q-ST-30-11C Rev.1

Definition

highest measured or predicted temperature at the junction within a semiconductor or micro-electronic device

Notes

NOTE Predicted temperature can be taken as Tcase + thermal resistance between junction and case times actual power (Watt) of the device.

Relations

ECSS-E-ST-50-11C — device
ECSS-Q-ST-70-38C Rev.1 Corr.1 — device

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