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SEE
Standard
ECSS-E-ST-10-04C Rev.1Definition
single-event effectNotes
Relations
- ECSS-E-ST-10-12C — critical charge
- ECSS-E-ST-70-32C — event
- ECSS-E-ST-70-31C — event
- ECSS-E-ST-40-07C — event
- ECSS-E-ST-20-01C — event
- ECSS-E-ST-10-12C — LET Threshold
- ECSS-E-ST-10-12C — radiation design margin (RDM)
- ECSS-E-ST-10-12C — radiation design margin (RDM)
- ECSS-E-ST-10-12C — single event effect (SEE)
- ECSS-E-ST-10-04C Rev.1 — single-event upset (SEU), single-event effect (SEE), single-event latch-up (SEL)
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