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component
Standard
ECSS-Q-ST-70-08C - Manual soldering of high-reliability electrical connections (6 March 2009)Definition
device which performs an electronic, electrical or electromechanical function and consists of one or more elements joined together and which cannot normally be disassembled without destructionNotes
- NOTE 1 The terms component and part can be interchanged.
- NOTE 2 Transistors, integrated circuits, hybrids, capacitors.
Relations
- ECSS-E-ST-20-08C Rev. 1 — acceptance test
- ECSS-E-ST-20-21C — actuator
- ECSS-E-ST-33-01C Rev.2 — actuator
- ECSS-Q-ST-30-11C Rev.1 — ambient temperature
- ECSS-Q-ST-70-29C — assembled article
- ECSS-E-ST-20-08C Rev. 1 — bare solar cell
- ECSS-E-ST-20-01C — batch
- ECSS-E-ST-20-01C — batch acceptance margin
- ECSS-E-ST-60-21C — bias instability
- ECSS-Q-ST-70-08C — bridging
- ECSS-Q-ST-30-11C Rev.1 — case temperature
- ECSS-Q-ST-60C Rev. 2 — characterization
- ECSS-E-ST-20-08C Rev. 1 — chip
- ECSS-Q-ST-70-08C — clinched-lead termination
- ECSS-E-ST-50-13C — communication device
- ECSS-Q-ST-70-08C — component lead
- ECSS-E-ST-40-07C — composite
- ECSS-E-ST-32-02C Rev. 1 — composite over-wrapped pressurized component (COPC)
- ECSS-E-ST-40-07C — composition
- ECSS-E-ST-40-07C — constructor
- ECSS-E-ST-40-07C — consumer
- ECSS-E-ST-10-04C Rev.1 — contaminant
- ECSS-E-ST-40-07C — contract
- ECSS-E-ST-32-02C Rev. 1 — COPC
- ECSS-S-ST-00-01C — COTS
- ECSS-E-ST-10-12C — COTS
- ECSS-E-ST-20-08C Rev. 1 — crack
- ECSS-E-ST-20-01C — critical gap
- ECSS-Q-ST-70-39C — critical structure
- ECSS-Q-ST-60-02C — data sheet
- ECSS-Q-ST-60-05C Rev. 1 — DCL
- ECSS-S-ST-00-01C — derating
- ECSS-E-ST-50-11C — device
- ECSS-Q-ST-70-38C Rev.1 Corr.1 — device
- ECSS-E-ST-50-14C — DHS core element
- ECSS-E-ST-50-14C — DHS peripheral element
- ECSS-E-ST-20-08C Rev. 1 — dig
- ECSS-E-ST-35C Rev. 1 — dimensioning
- ECSS-E-ST-35C Rev. 1 — envelope
- ECSS-E-ST-40-07C — event manager
- ECSS-E-ST-40-07C — event sink
- ECSS-E-ST-40-07C — event source
- ECSS-E-ST-32-02C Rev. 1 — fitting
- ECSS-S-ST-00-01C — function
- ECSS-M-ST-10C Rev. 1 — function
- ECSS-E-ST-20-01C — heritage
- ECSS-Q-ST-30-11C Rev.1 — hot spot temperature
- ECSS-E-ST-20-08C Rev. 1 — in-process testing
- ECSS-E-ST-20-08C Rev. 1 — inclusion
- ECSS-E-ST-33-11C Rev.1 — initiator
- ECSS-E-ST-35C Rev. 1 — limit testing
- ECSS-E-ST-33-11C Rev.1 — limit testing
- ECSS-E-ST-40-07C — logger
- ECSS-S-ST-00-01C — material
- ECSS-E-ST-32C Rev. 1 — maximum expected operating pressure (MEOP)
- ECSS-E-ST-32-02C Rev. 1 — metallic pressurized component (MPC)
- ECSS-E-ST-40-07C — model
- ECSS-E-ST-32-02C Rev. 1 — MPC
- ECSS-E-ST-20-08C Rev. 1 — nick
- ECSS-Q-ST-70-39C — non-critical structure
- ECSS-E-ST-40-07C — operation
- ECSS-E-ST-60-20C Rev. 2 — optical system
- ECSS-E-ST-40-07C — package
- ECSS-S-ST-00-01C — part
- ECSS-E-ST-32-02C Rev. 1 — PC
- ECSS-E-ST-32-02C Rev. 1 — pressure component (PC)
- ECSS-E-ST-35C Rev. 1 — pressure drop coefficient
- ECSS-Q-ST-60-05C Rev. 1 — production lot
- ECSS-E-ST-40-07C — property
- ECSS-E-ST-40-07C — provider
- ECSS-E-ST-10-12C — radiation design margin (RDM)
- ECSS-E-ST-10-12C — radiation design margin (RDM)
- ECSS-Q-ST-30-11C Rev.1 — rating
- ECSS-E-ST-31-04C — reader
- ECSS-E-ST-40-07C — reference
- ECSS-E-ST-40C — regression testing (software)
- ECSS-Q-ST-80C Rev.1 — regression testing (software)
- ECSS-S-ST-00-01C — relifing
- ECSS-Q-ST-70-28C — repair
- ECSS-E-ST-40-07C — resolver
- ECSS-Q-ST-70-28C — rework
- ECSS-E-ST-20-01C — RF boundary conditions
- ECSS-E-ST-60-21C — scale factor non linearity error
- ECSS-Q-ST-10-09C Rev. 1 — SCC
- ECSS-E-ST-40-07C — scheduler
- ECSS-E-ST-20-08C Rev. 1 — scratch
- ECSS-Q-ST-70-38C Rev.1 Corr.1 — sensitive devices
- ECSS-E-ST-40-07C — service
- ECSS-S-ST-00-01C — solar cell
- ECSS-E-ST-40-07C — source
- ECSS-E-ST-70-32C — step
- ECSS-Q-ST-70-08C — stress relief
- ECSS-Q-ST-80C Rev.1 — stress test
- ECSS-E-ST-40C — stress test
- ECSS-E-ST-40-07C — target
- ECSS-E-ST-40-07C — time keeper
- ECSS-E-ST-70-32C — watchdog step
- ECSS-E-ST-31-04C — writer
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